本帖最后由 无心飘落 于 2011-11-29 20:16 编辑
intel SSD Toolbox SMART信息
解释：
03 – Spin Up Time （磁头加载时间）
The average time it takes the spindle to spin up. Since an SSD has no moveable
parts, this attribute reports a fixed raw value of zero (0) and a fixed normalized
value of 100. Use the Raw value for this attribute.
（SSD没这东西，所以这个值 固定为0）
04 – Start/Stop Count （开始/停止计数）
This type of event is not an issue for SSDs. However, hard disk drives can
experience only a finite number of these events and, therefore, must be tracked.
This attribute reports a fixed value of zero (0) and a fixed normalized value of 100.
Use the Raw value for this attribute.
（不知道，反正数值无意义）
05 – Re-Allocated Sector Count （重映射扇区数）
This attribute shows the number of retired blocks since leaving the factory (also
known as a grown defect count).
The lithography (litho) of your drive determines which count you should use. Refer
to the drive name in the Select a Drive section. A ―1‖ in the twelfth position
indicates a 50nm drive, while a ―2‖ indicates a 34nm. For example in Figure 22:
SSDSA2M160G2GN indicates a 34nm drive.
For 50nm drives, the normalized value has an initial value of 100 but counts up from
1 for every 4 grown defects. The normalized value of this attribute becomes 1 when
there are 4 grown defects; the value is 2 when there are 8 grown defects, etc. See
the following table for details.
（随着重映射扇区数的增长而增加【G1，G2不同】）
09 – Power-On Hours Count （通电时间）
This attribute reports the cumulative number of power-on hours over the life of the
device. Use the Raw value for this attribute.
Note: The On/Off status of the device initiated power management (DIPM) feature affects
the number of hours reported.
If DIPM is turned ―On‖, the recorded value for power-on hours does not include
the time that the device is in a ―slumber‖ state.
If DIPM is turned ―Off‖, the recorded value for power-on hours should match the
clock time, as all three device states are counted: active, idle and slumber.
（累积通电时间）
0C – Power Cycle Count （通断电次数）
This attribute reports the cumulative number of power cycle events (power on/off
cycles) over the life of the device. Use the Raw value for this attribute.
（开关机的次数）
C0 – Unsafe Shutdown Count （异常关机次数）
This attribute reports the cumulative number of unsafe (unclean) shutdown events
over the life of the device. An unsafe shutdown occurs whenever the device is
powered off without STANDBY IMMEDIATE being the last command. Use the Raw
value for this attribute.
（非正常断电后增长）
E1 – Host Writes （数据写入量）
This attribute reports the total number of sectors written by the host system. The
raw value is increased by 1 for every 65,536 sectors written by the host. Use the
Raw value for this attribute.
（SSD数据写入量）
E8 – Available Reserved Space （可用预留空间）
This attribute reports the number of reserve blocks remaining. The attribute value
begins at 100 (64h), which indicates that the reserved space is 100 percent
available. The threshold value for this attribute is 10 percent availability, which
indicates that the drive is close to its end of life. Use the Normalized value for this
attribute.
（这个算是颗粒寿命，等于低于10%SSD就离躺倒不远了）
E9 – Media Wearout Indicator （闪存磨耗指数）
This attribute reports the number of cycles the NAND media has experienced.
The normalized value declines linearly from 100 to 1 as the average erase cycle
count increases from 0 to the maximum rated cycles.
Once the normalized value reaches 1, the number does not decrease, although it is
likely that significant additional wear can be put on the device. Use the Normalized
value for this attribute.
（如E8上面，等到低于10%，在没有预留可用空间的情况下，跌的可快了呢- -）
B8 – End to End Error Detection Count （端对端错误监测数）
This attribute is only available for 34nm, G2 drives and counts the number of times
errors are encountered during logical block addressing (LBA) tag checks on the data
path within the drive. Use the Normalized value for this attribute.
（LBA映射错误增长的数值？） |
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